“Fluctuation electron microscopy”的意思、由来-开放百科全书

词条

Fluctuation electron microscopy

释义

References

Fluctuation electron microscopy (FEM) is a technique in electron microscopy that probes nanometer-scale or “medium-range” order in disordered materials. The first studies were performed on amorphous Ge (Treacy and Gibson 1997)^[1] and later on amorphous silicon and hydrogenated amorphous silicon.^[2]

References

1. ^{{cite journal|author=Treacy, Gibson|title=Diminished medium-range order observed in annealed amorphous germanium|journal=Physical Review Letters|year=1997|url=http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.78.1074|volume=78|page=1074|doi=10.1103/PhysRevLett.78.1074}}
2. ^{{cite journal|author=P. M. Voyles, J. E. Gerbi, M. M. J. Treacy, J. M. Gibson, and J. R. Abelson|title=Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature|journal=Physical Review Letters|year=1997|volume=86|page=5514|doi=10.1103/PhysRevLett.86.5514|url=http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.86.5514}}

1 : Electron microscopy

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