| 词条 | IEEE Design & Test of Computers |
| 释义 |
|title= IEEE Design & Test | former_names = IEEE Design & Test of Computers | editor = Joerg Henkel | discipline = | abbreviation = | publisher = IEEE | country = USA | based = New York City | frequency = Bi-monthly | founded = 1984 | license = | impact = 1.14 | impact-year = 2013 | website = http://ieee-ceda.org/publications/d-t | link1 = http://ieeexplore.ieee.org/xpl/aboutJournal.jsp?punumber=6221038 | link1-name = Online access | link2 = | link2-name = | JSTOR = | OCLC = 57216796 | LCCN = | CODEN = | ISSN = 2168-2356 | eISSN = }} IEEE Design & Test of Computers, or IEEE Design & Test, or simply Design & Test, is a magazine is cosponsored by the Council on EDA, Circuits and Systems Society, and the IEEE Solid State Circuits Society of the IEEE. It is a magazine, rather than a scholarly journal, and hence has articles of general interest to those working in the field, not just research articles. The web site of the magazine states the charter as offering "original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software." The current editor is Joerg Henkel of Karlsruhe Institute of Technology. See also
5 : American computer magazines|American bimonthly magazines|IEEE magazines|Magazines established in 1984|Magazines published in New York City |
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