| 词条 | Fluorescent microthermography |
| 释义 |
Fluorescent microthermography (FMT) is a microscopy technique for infrared imaging of temperature distribution in small scale; the achievable spatial resolution is half micrometer and temperature resolution of 0.005 K. Time-dependent measurements are possible, as the fluorescence lifetime is only about 200 microseconds. A thin film of a phosphor, europium thenoyl-trifluoroacetonate, is applied on the surface (e.g. an integrated circuit die) and illuminated by ultraviolet light at 340–380 nm, stimulating fluorescence at mainly 612 nm line. The quantum efficiency of fluorescence decreases exponentially with temperature, differences in emitted light intensity can be therefore used to assess differences on surface temperature, with hot areas showing as darker.[1] References1. ^{{cite book|url=https://books.google.com/books?id=OX2cHKJWCKgC&pg=PA713&dq=semiconductor+failure+microphotograph&lr=&as_drrb_is=q&as_minm_is=0&as_miny_is=&as_maxm_is=0&as_maxy_is=&num=50&as_brr=3&cd=3#v=onepage&q=&f=false|title=Semiconductor Material and Device Characterization|first=Dieter K.|last=Schroder|date=10 February 2006|publisher=John Wiley & Sons|via=Google Books|isbn=9780471749080}} {{tech-stub}} 4 : Infrared imaging|Microscopy|Thermometers|Measurement |
| 随便看 |
|
开放百科全书收录14589846条英语、德语、日语等多语种百科知识，基本涵盖了大多数领域的百科知识，是一部内容自由、开放的电子版国际百科全书。