词条 | Park Systems |
释义 |
| name = Park Systems | logo = Park logo.jpg | logo_size = 130px | type = Public | traded_as = {{kosdaq|140860}} | foundation = April 7, 1997 (as PSIA Inc.) | location = Suwon, South Korea and Santa Clara, California, USA | key_people = Dr. Sang-il Park (Founder), (CEO) & (Chairman) | area_served = Worldwide | industry = Nanotechnology | products = Research AFMs Industrial AFMs | num_employees = Over 180 - Dec. 2018 | homepage = }} Park Systems CorporationPark Systems Corp. was founded as PSIA in 1997 by Dr. Sang-il Park, a co-founder of Park Scientific Instruments, one of the pioneers in developing commercialized AFM. PSIA changed its name to Park Systems to reflect the company’s focus on total metrological solutions and atomic force Microscopes and scanning probe microscopes for both small and large-sample measurement. Beside the nanoscale microscopy tools for research applications the company also offers an industrial product line that extends its innovative NX technology to a variety of metrological applications, including hard disk inspection, next-generation sliders, sidewall/overhang imaging and profiling, Semiconductor and Wafer-Fab manufacturing.[1] [2] [3] [4] In December 2015, Park Systems held its IPO, joining the KOSDAQ Composite Index. The company holds several unique distinctions such as being the first company listed on the KOSDAQ to receive multiple “AA” ratings on technical evaluations of their technologies. [5] Product LinesPark Systems' AFM product lines are designed specifically to be used in materials science, electronics, life science, nanotechnology, and other areas of research and industry. They are characteristic for their innovative features, such as True-Non Contact™ mode, decoupled XY and Z architecture, SmartScan operating software and full automation. Park Systems offers 2 main product lines: A. Research Products: Park NX10, Park NX20, Park NX-Hivac, Park NX12-Bio, Park XE7, Park XE15. B. Industrial Products: Park WAFER series, Park 3DM series, Park HDM series, Park PTR series. Dr. Sang-il Park—Founder, Chairman and CEO of Park SystemsDr. Park is the pioneer in AFM industry where he took the lead in commercializing the early AFM technology by founding Park Scientific Instruments (PSI) in California, where he served as the Chairman and CEO for 9 years (1988~1997). Prior to founding PSI, he worked with Prof. C.F. Quate at Stanford University, the birthplace of the AFM. His contribution to the AFM industry and business has been recognized by numerous awards, including Iron Tower Order of Industrial Service Merit (by Republic of Korea, 2005){{cn|date=November 2018}} and Industrial Technology Innovation Award (by Minister of Commerce, Industry, and Energy, Republic of Korea, 2004).{{cn|date=November 2018}} He has authored numerous research papers, text books, and eighteen U.S. patents.{{cn|date=November 2018}} He also serves as the Director of the Korean Nanotechnology Research Society, a member of the Nanotechnology Steering Committee at Korean Ministry of Science and Technology, and the Nanotechnology Information Committee at KISTI. Dr. Park has a Ph.D. in applied physics from Stanford University and B.S. in physics from Seoul National University.{{cn|date=March 2018}} 1. ^{{Cite web|url=https://www.parksystems.com/index.php/applications/manufacturing/semiconductor/376-park-systems-application-note-automatic-defect-review-adr-of-300mm-bare-wafers-with-automated-afm|title=Automatic Defect Review (ADR) of 300mm Bare Wafers with Automated AFM|website=www.parksystems.com|language=en-gb|access-date=2018-11-09}} 2. ^{{Cite web|url=https://www.parksystems.com/index.php/applications/manufacturing/semiconductor/197-high-throughput-and-non-destructive-sidewall-roughness-measurement-using-3-dimensional-afm|title=High Throughput and Non-Destructive Sidewall Roughness Measurement Using 3-Dimensional AFM|website=www.parksystems.com|language=en-gb|access-date=2018-11-09}} 3. ^{{Cite web|url=https://www.parksystems.com/index.php/applications/manufacturing/semiconductor/194-new-3d-afm-for-high-resolution-sidewall-imaging|title=New 3D-AFM for High Resolution Sidewall Imaging|website=www.parksystems.com|language=en-gb|access-date=2018-11-09}} 4. ^{{Cite web|url=https://www.parksystems.com/index.php/applications/manufacturing/mems/195-new-3-dimensional-afm-for-cd-measurement-and-sidewall-characterization|title=New 3-Dimensional AFM for CD Measurement and Sidewall Characterization|website=www.parksystems.com|language=en-gb|access-date=2018-11-09}} 5. ^{{Cite news|url=https://www.prweb.com/releases/2015/12/prweb13130629.htm|title=Park Systems, World Leading Manufacturer of Atomic Force Microscopes with AA Rating Announces One Million Shares in IPO Listing on KOSDAQ|work=PRWeb|access-date=2018-11-09}} 1 : Nanotechnology companies |
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